Si5 52
Table 5. CLK± Output Phase Jitter (Continued)
Parameter
Symbol
Test Condition
Min
Typ
Max
Units
Phase Jitter (RMS) 1,2,5
? J
Kv = 33 ppm/V
ps
for F OUT 10 to 160 MHz
CMOS Output Only
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
0.63
0.62
Kv = 45 ppm/V
ps
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
Kv = 90 ppm/V
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
Kv = 135 ppm/V
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
Kv = 180 ppm/V
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
Kv = 356 ppm/V
12 kHz to 20 MHz (OC-48)
50 kHz to 20 MHz
0.63
0.62
0.67
0.66
0.74
0.72
0.83
0.8
1.26
1.2
ps
ps
ps
ps
Notes:
1. Refer to AN255, AN256, and AN266 for further information.
2. For best jitter and phase noise performance, always choose the smallest K V that meets the application’s minimum APR
requirements. See “AN266: VCXO Tuning Slope (K V ), Stability, and Absolute Pull Range (APR)” for more information.
3. See “AN255: Replacing 622 MHz VCSO devices with the Si550 VCXO” for comparison highlighting power supply
rejection (PSR) advantage of Si55x versus SAW-based solutions.
4. Max jitter for LVPECL output with V C =1.65V, V DD =3.3V, 155.52 MHz.
5. Max offset frequencies: 80 MHz for F OUT > 250 MHz, 20 MHz for 50 MHz < F OUT <250 MHz,
2 MHz for 10 MHz < F OUT <50 MHz.
Table 6. CLK± Output Period Jitter
Parameter
Period Jitter*
Symbol
J PER
Test Condition
RMS
Peak-to-Peak
Min
Typ
2
14
Max
Units
ps
ps
*Note: Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles. Refer to AN279 for further information.
6
Rev. 1.1
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